Product details:
| ISBN13: | 9780443317200 |
| ISBN10: | 0443317208 |
| Binding: | Hardback |
| No. of pages: | 232 pages |
| Size: | 228x152 mm |
| Language: | English |
| 700 |
Category:
Advances in Optics of Charged Particle Analyzers: Part 2
Series:
Advances in Imaging and Electron Physics;
233;
Publisher: Academic Press
Date of Publication: 1 April 2025
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Long description:
Advances in Optics of Charged Particle Analyzers: Part Two, Volume 233 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The release in the series features articles on Electrostatic Energy, Mass Analyzers With Combined Electrostatic and Magnetic Fields, Mass Analyzers based on Fourier Transform, Principles of Time-of-Flight Mass Analyzers, Multi-Pass Time-of-Flight Mass Analyzers, and Radiofrequency Mass Analyzers.
Table of Contents:
Prefece
1. Electrostatic Energy Analyzers
Mikhail Yavor
2. Mass Analyzers With Combined Electrostatic and Magnetic Fields
Mikhail Yavor
3. Mass Analyzers based on Fourier Transform
Mikhail Yavor
4. Principles of Time-of-Flight Mass Analyzers
Mikhail Yavor
5. Multi-Pass Time-of-Flight Mass Analyzers
Mikhail Yavor
6. Radiofrequency Mass Analyzers
Mikhail Yavor
1. Electrostatic Energy Analyzers
Mikhail Yavor
2. Mass Analyzers With Combined Electrostatic and Magnetic Fields
Mikhail Yavor
3. Mass Analyzers based on Fourier Transform
Mikhail Yavor
4. Principles of Time-of-Flight Mass Analyzers
Mikhail Yavor
5. Multi-Pass Time-of-Flight Mass Analyzers
Mikhail Yavor
6. Radiofrequency Mass Analyzers
Mikhail Yavor
