Advances in Optics of Charged Particle Analyzers: Part 2
Series: Advances in Imaging and Electron Physics; 233;
- Publisher's listprice EUR 175.00
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74 235 Ft (70 700 Ft + 5% VAT)
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74 235 Ft
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Product details:
- Publisher Academic Press
- Date of Publication 18 April 2025
- ISBN 9780443317200
- Binding Hardback
- No. of pages298 pages
- Size 229x152 mm
- Weight 450 g
- Language English 700
Categories
Long description:
Advances in Optics of Charged Particle Analyzers: Part Two, Volume 233 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The release in the series features articles on Electrostatic Energy, Mass Analyzers With Combined Electrostatic and Magnetic Fields, Mass Analyzers based on Fourier Transform, Principles of Time-of-Flight Mass Analyzers, Multi-Pass Time-of-Flight Mass Analyzers, and Radiofrequency Mass Analyzers.
- Provides the authority and expertise of leading contributors from an international board of authors
- Presents the latest release in the Advances in Imaging and Electron Physics series
- Features articles on Electrostatic Energy, Mass Analyzers With Combined Electrostatic and Magnetic Fields, and more
Table of Contents:
Prefece
1. Electrostatic Energy Analyzers
Mikhail Yavor
2. Mass Analyzers With Combined Electrostatic and Magnetic Fields
Mikhail Yavor
3. Mass Analyzers based on Fourier Transform
Mikhail Yavor
4. Principles of Time-of-Flight Mass Analyzers
Mikhail Yavor
5. Multi-Pass Time-of-Flight Mass Analyzers
Mikhail Yavor
6. Radiofrequency Mass Analyzers
Mikhail Yavor
