Introduction to Conventional Transmission Electron Microscopy - De Graef, Marc; - Prospero Internet Bookshop

Introduction to Conventional Transmission Electron Microscopy

 
Publisher: Cambridge University Press
Date of Publication:
 
Normal price:

Publisher's listprice:
GBP 107.00
Estimated price in HUF:
56 175 HUF (53 500 HUF + 5% VAT)
Why estimated?
 
Your price:

44 940 (42 800 HUF + 5% VAT )
discount is: 20% (approx 11 235 HUF off)
Discount is valid until: 31 December 2024
The discount is only available for 'Alert of Favourite Topics' newsletter recipients.
Click here to subscribe.
 
Availability:

Estimated delivery time: In stock at the publisher, but not at Prospero's office. Delivery time approx. 3-5 weeks.
Not in stock at Prospero.
Can't you provide more accurate information?
 
  Piece(s)

 
Short description:

A graduate level textbook covering the fundamentals of conventional transmission electron microscopy, first published in 2003.

Long description:
This 2003 book covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text. The book starts with the basics of crystallography and quantum mechanics providing a sound mathematical footing for the rest of the text. The next section deals with the microscope itself, describing the various components in terms of the underlying theory. The second half of the book focuses on the dynamical theory of electron scattering in solids including its applications to perfect and defective crystals, electron diffraction and phase contrast techniques. Based on a lecture course given by the author in the Department of Materials Science and Engineering at Carnegie Mellon University, the book is ideal for graduate students as well as researchers new to the field.

'... ideal for students as well as for researchers new to the field.' Materials World
Table of Contents:
1. Basic crystallography; 2. Basic quantum mechanics; 3. The transmission electron microscope; 4. Getting started; 5. Dynamical electron scattering in perfect crystals; 6. Two-beam theory in defect-free crystals; 7. Systematic row and zone axis orientations; 8. Defects in crystals; 9. Electron diffraction patterns; 10. Phase contrast microscopy; Appendices.