Statistical Modeling and Robust Inference for One-shot Devices
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Product details:
- Publisher Academic Press
- Date of Publication 8 April 2025
- ISBN 9780443141539
- Binding Paperback
- No. of pages220 pages
- Size 229x152 mm
- Weight 450 g
- Language English 700
Categories
Long description:
The study of one-shot devices such as automobile airbags, fire extinguishers, or antigen tests, is rapidly becoming an important problem in the area of reliability engineering. These devices, which are destroyed or must be rebuilt after use, are a particular case of extreme censoring, which makes the problem of estimating their reliability and lifetime challenging. However, classical statistical and inferential methods do not consider the issue of robustness.
Statistical Modeling and Robust Interference for One-shot Devices offers a comprehensive investigation of robust techniques of one-shot devices under accelerated-life tests. With numerous examples and case studies in which the proposed methods are applied, this book includes detailed R codes in selected chapters to help readers implement their own codes and use them in the proposed examples and in their own research on one-shot devicetesting data. Researchers, mathematicians, engineers, and students working on acceleratedlife testing data analysis and robust methodologies will find this to be a welcome resource.
- Offers an indepth review of statistical methods for the testing and analysis of one-shot devices
- Includes numerous examples and case studies in which the proposed methods are applied
- Introduces detailed R codes in selected chapters to help readers implement their own codes, use them in the proposed examples and in their own research on one-shot device-testing data
Table of Contents:
1. Introduction
2. Inference for One-Shot Devices with a Single Failure mode
3. Divergence Measures and their Application to One-Shot Devices with a Single Failure mode
4. Robust Inference under the Exponential Distribution
5. Robust Inference under the Gamma Distribution
6. Robust Inference under the Weibull Distribution
7. Robust Inference under the Lognormal distribution
8. Robust Inference under the Proportional Hazards Model
9. Inference for One-Shot Devices with Multiple Failure Modes
10. Robust Inference under the Exponential Distribution and Competing Risks
11. Robust Inference under the Weibull Distribution and Competing Risks
12. Robust Inference under Cyclic Accelerated Life Tests
13. Summary and Future Directions
Appendix A Derivation of the Influence Function of the Weighted Minimum DPD Estimators
