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    Structural Decision Diagrams in Digital Test: Theory and Applications

    Structural Decision Diagrams in Digital Test by Ubar, Raimund; Raik, Jaan; Jenihhin, Maksim;

    Theory and Applications

    Series: Computer Science Foundations and Applied Logic;

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      • Publisher's listprice EUR 235.39
      • The price is estimated because at the time of ordering we do not know what conversion rates will apply to HUF / product currency when the book arrives. In case HUF is weaker, the price increases slightly, in case HUF is stronger, the price goes lower slightly.

        99 852 Ft (95 097 Ft + 5% VAT)
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      • Discounted price 91 864 Ft (87 489 Ft + 5% VAT)

    99 852 Ft

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    Availability

    Estimated delivery time: In stock at the publisher, but not at Prospero's office. Delivery time approx. 3-5 weeks.
    Not in stock at Prospero.

    Why don't you give exact delivery time?

    Delivery time is estimated on our previous experiences. We give estimations only, because we order from outside Hungary, and the delivery time mainly depends on how quickly the publisher supplies the book. Faster or slower deliveries both happen, but we do our best to supply as quickly as possible.

    Product details:

    • Publisher Birkhäuser
    • Date of Publication 16 February 2025
    • Number of Volumes 1 pieces, Book

    • ISBN 9783031447365
    • Binding Paperback
    • No. of pages595 pages
    • Size 235x155 mm
    • Language English
    • Illustrations 256 Illustrations, black & white; 62 Illustrations, color
    • 688

    Categories

    Short description:

    This is the first book that sums up test-related modeling of digital circuits and systems by a new structural-decision-diagrams model. The model represents structural and functional information jointly and opens a new area of research.

    The book introduces and discusses applications of two types of structural decision diagrams (DDs): low-level, structurally synthesized binary DDs (SSBDDs) and high-level DDs (HLDDs) that enable diagnostic modeling of complex digital circuits and systems.



    Topics and features:



    • Provides the definition, properties and techniques for synthesis, compression and optimization of SSBDDs and HLDDs
    • Provides numerous working examples that illustrate the key points of the text
    • Describes applications of SSBDDs and HLDDs for various electronic design automation (EDA) tasks, such as logic-level fault modeling and simulation, multi-valued simulation, timing-critical path identification, and test generation
    • Discusses the advantages of the proposed model to traditional binary decision diagrams and other traditional design representations
    • Combines SSBDDs with HLDDs for multi-level representation of digital systems for enabling hierarchical and cross-level solving of complex test-related tasks











    This unique book is aimed at researchers working in the fields of computer science and computer engineering, focusing on test, diagnosis and dependability of digital systems. It can also serve as a reference for graduate- and advanced undergraduate-level computer engineering and electronics courses.



    Three authors are affiliated with the Dept. of Computer Systems at the Tallinn University of Technology, Estonia: Raimund Ubar is a retired Professor, Jaan Raik and Maksim Jenihhin are tenured Professors. Artur Jutman, PhD, is a researcher at the same university and the CEO of TestonicaLab Ltd., Estonia.

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    Long description:

    This is the first book that sums up test-related modeling of digital circuits and systems by a new structural-decision-diagrams model. The model represents structural and functional information jointly and opens a new area of research.

    The book introduces and discusses applications of two types of structural decision diagrams (DDs): low-level, structurally synthesized binary DDs (SSBDDs) and high-level DDs (HLDDs) that enable diagnostic modeling of complex digital circuits and systems.

    Topics and features:

    • Provides the definition, properties and techniques for synthesis, compression and optimization of SSBDDs and HLDDs
    • Provides numerous working examples that illustrate the key points of the text
    • Describes applications of SSBDDs and HLDDs for various electronic design automation (EDA) tasks, such as logic-level fault modeling and simulation, multi-valued simulation, timing-critical path identification, and test generation
    • Discusses the advantages of the proposed model to traditional binary decision diagrams and other traditional design representations
    • Combines SSBDDs with HLDDs for multi-level representation of digital systems for enabling hierarchical and cross-level solving of complex test-related tasks

    This unique book is aimed at researchers working in the fields of computer science and computer engineering, focusing on test, diagnosis and dependability of digital systems. It can also serve as a reference for graduate- and advanced undergraduate-level computer engineering and electronics courses.

    Three authors are affiliated with the Dept. of Computer Systems at the Tallinn University of Technology, Estonia: Raimund Ubar is a retired Professor, Jaan Raik and Maksim Jenihhin are tenured Professors. Artur Jutman, PhD, is a researcher at the same university and the CEO of Testonica Lab Ltd., Estonia.

    More

    Table of Contents:

    Chapter 1: Introduction.- Chapter 2: Overview of structural decision diagrams.- Chapter 3: Structurally Synthesized Binary Decision Diagrams.- Chapter 4: Fault modeling in digital circuits.- Chapter 5: Logic-level fault simulation.- Chapter 6: Test generation, fault diagnosis and testability.- Chapter 7: High-Level Decision Diagrams.- Chapter 8: Test generation for microprocessors with HLDDs.

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