Advanced Materials Characterization - Kumar, Ch Sateesh; Singh, M. Muralidhar; Krishna, Ram; - Prospero Internetes Könyváruház
Kosár (0)
Kívánságlista (0)
Értesítés a kedvenc témákról
__

Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions
 
A termék adatai:
ISBN13:9781032375106
ISBN10:1032375108
Kötéstípus:Keménykötés
Terjedelem:144 oldal
Méret:234x156 mm
Súly:335 g
Nyelv:angol
Illusztrációk: 57 Illustrations, black & white; 5 Halftones, black & white; 52 Line drawings, black & white
509
Témakör:

Advanced Materials Characterization

Basic Principles, Novel Applications, and Future Directions
 
Kiadás sorszáma: 1
Kiadó: CRC Press
Megjelenés dátuma:
 
Normál ár:
Kiadói listaár:
GBP 115.00
Becsült forint ár:
58 201 Ft (55 430 Ft + 5% áfa)
Miért becsült?
 
Az Ön ára:
52 381 (49 887 Ft + 5% áfa )
Kedvezmény(ek): 10% (kb. 5 820 Ft)
A kedvezmény csak az 'Értesítés a kedvenc témákról' hírlevelünk címzettjeinek rendeléseire érvényes.
Kattintson ide a feliratkozáshoz
 
Beszerezhetőség:
Becsült beszerzési idő: A Prosperónál jelenleg nincsen raktáron, de a kiadónál igen. Beszerzés kb. 3-5 hét..
A Prosperónál jelenleg nincsen raktáron.
Nem tudnak pontosabbat?
 
Kosárba teszek
  példányt

 
Rövid leírás:

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.

Hosszú leírás:

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis.


Features:



  • Covers material characterization techniques and the development of advanced characterization technology

  • Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints

  • Discusses advanced material characterization technology in the microstructural and property characterization fields

  • Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties

  • Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies

This book is aimed at graduate students and researchers in materials science and engineering.

Tartalomjegyzék:
1.Introduction to material characterization 2. X-Ray Diffraction (XRD) 3. Nanomechanical system 4. X-Ray photo spectroscopy (XPS) 5. Scanning electron microscope (SEM) 6. Field emission scanning electron microscope (FESEM) 7. Transmission electron microscope (TEM) 8. Atomic Force Microscope (AFM) 9. Near-field scanning optical microscope Raman 10. Optical characterization instruments 11. Synchrotron techniques 12. Other advanced instruments used for characterization of functionally graded materials