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    In-situ Materials Characterization: Across Spatial and Temporal Scales

    In-situ Materials Characterization by Ziegler, Alexander; Graafsma, Heinz; Zhang, Xiao Feng;

    Across Spatial and Temporal Scales

    Sorozatcím: Springer Series in Materials Science; 193;

      • 8% KEDVEZMÉNY?

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        45 385 Ft (43 223 Ft + 5% áfa)
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      • Discounted price 41 753 Ft (39 765 Ft + 5% áfa)

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    A termék adatai:

    • Kiadás sorszáma Softcover reprint of the original 1st ed. 2014
    • Kiadó Springer
    • Megjelenés dátuma 2016. augusztus 23.
    • Kötetek száma 1 pieces, Previously published in hardcover

    • ISBN 9783662519769
    • Kötéstípus Puhakötés
    • Terjedelem256 oldal
    • Méret 235x155 mm
    • Súly 4102 g
    • Nyelv angol
    • Illusztrációk 46 Illustrations, black & white; 78 Illustrations, color
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    Kategóriák

    Rövid leírás:

    The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly, or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes, and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical, and x-ray microscopies (e.g., scanning, transmission, and low-energy electron microscopy, and scanning probe microscopy), or in the scattering realm with x-ray, neutron and electron diffraction.

    Több

    Hosszú leírás:

    The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical and x-ray microscopies (e.g. scanning, transmission and low-energy electron microscopy and scanning probe microscopy) or in the scattering realm with x-ray, neutron and electron diffraction.

    Több

    Tartalomjegyzék:

    Scanning Probe Microscopy on 'Live' Catalysts.- In-situ X-ray diffraction at synchrotron and Free-Electron-Laser sources.- Advanced in situ transmission electron microscopy.- Ultra-fast TEM and Electron Diffraction.- In-Situ Materials Characterization with FIB/SEM.- In-situ X-ray photoelectron spectroscopy.- ?Real-time? probing of photo-induced molecular processes in liquids by ultrafast  X-ray absorption spectroscopy.- Time-Resolved Neutron Scattering.- Novel Detectors for Ultra-fast XRD, TEM and ED Characterization.

    Több
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