Advances in Optics of Charged Particle Analyzers: Part 1, Volume 232 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Specific chapters cover Introduction to inverse problems in electron microscopy, Directional sinogram inpainting for limited angle tomography, Strain tomography of crystals, FISTA with adaptive discretization, Total variation discretization, and Reconstruction with a Gaussian Dictionary.

Provides the authority and expertise of leading contributors from an international board of authors
Presents the latest release in the Advances in Imaging and Electron Physics series

Tartalomjegyzék:

Preface
1. Charged Particles in Electromagnetic Fields
Mikhail Yavor
2. Language of Aberration Expansions in Charged Particle Optics
Mikhail Yavor
3. Transporting Charged Particle Beams in Static Fields
Mikhail Yavor
4. Transporting Charged Particles in Radiofrequency Fields
Mikhail Yavor
5. Transporting and Separating Ions in Gas-Filled Channels
Mikhail Yavor
6. Static Magnetic Charged Particle Analyzers
Mikhail Yavor

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Advances in Optics of

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Digitális jel-, hang- és képfeldolgozás

Elektromosságtan, mágnességtan

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Digitális jel-, hang- és képfeldolgozás (karitatív célú kampány)

Elektromosságtan, mágnességtan (karitatív célú kampány)

Advances in Optics of Charged Particle Analyzers: Part 1